Raman Scattering Measurements in Si-Doped GaN
スポンサーリンク
概要
著者
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Shin E‐j
Korea Research Institute Of Standards And Science
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Kim Dongho
Korea Research Institute Of Standards And Science
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Dongho Kim
Korea Research Institute Of Standards And Science
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Ki Young
Department Of Physics Semiconductor Physics Research Center Chonbuk National University
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Sung-jin Son
Department Of Physics Semiconductor Physics Research Center Chonbuk National University
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In-hwan Lee
Department Of Materials Engineering Korea University
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In-hoon Choi
Department Of Materials Engineering Korea University
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Cheul-ro Lee
Korea Research Institute Of Standards And Science
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Hyung Jae
Department Of Physics Semiconductor Physics Research Center Chonbuk National University
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Sam Kyu
Korea Research Institute Of Standards And Science
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Eun-joo SHIN
Korea Research Institute of Standards and Science
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Shin Eun-Joo
Korea Research Institute of Standards and Science
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Lee Cheul-Ro
Korea Research Institute of Standards and Science
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KI Young
Department of Electrical and Electronic Engineering, Yonsei University
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- Raman Scattering Measurements in Si-Doped GaN
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