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Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China | 論文著者
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Liu Yuan
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China
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Yao Ruo-He
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China
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Li Bin
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China
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Deng Wanling
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China
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Zheng Xueren
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China
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Chen Rongsheng
Institute of Microelectronics, South China University of Technology, Guangzhou 510640, China