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Unisoku Co. | 論文
- Development of Electron Source for Auger Electron Spectroscopy in Scanning Probe Microscope Systems
- Analysis of Heat-Treated 6H-SiC (0001) Surface Using Scanning Tunneling Microscopy
- Optimization of the piezoresistive AFM cantilever design for using at cryogenic temperature
- Phase Transition between c(4 × 2) and p(2 × 2) Structures of the Si(100) Surface at 6 K Caused by the Fluctuation of Phase Defects on Dimer Rows due to Dimer Flip-Flop Motion
- TiO_2(110) Surface Preparation by UV Light Irradiation for STM Observations
- Near Field Stimulated Time of Flight Mass Surface Analyzer
- Development of Scanning Probe Microscope for Auger Analysis