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Ulsi Research Laboratories Research And Development Center Toshiba Corporation | 論文
- Re-Oxidation of Thermally Nitrided Silicon Dioxide Thin Films
- Possible Control Method for Single Electron Tunneling Based on Environmental Impedance Modulation
- Controllability of Single E1ectron Tunneling and Change in Coulomb Diamond Caused by Environmental Impedance Modulation
- Single E1ectron Tunneling Device Controlled by Environmental Impedance Modulation