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ULVAC-PHI Inc. | 論文
- Development of Photoelectron Microscope with Compact X-Ray Source Generated by Line-Focused Laser Irradiation
- 25pB02 線集光型レーザープラズマX線源による光電子顕微鏡の開発(プラズマ応用, (社) プラズマ・核融合学会第21回年会)
- Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy
- XPSの微小領域分析と顕微法
- Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use
- Site-Selective Analysis of Local Electronic Structures in GaAs_P_x Alloy Semiconductors by Auger Valence Electron Spectroscopy
- XHV System for Surface Analysis Using a New Getter to Reduce Hydrogen
- Determination of Pb, Ag, Cu and Mn in Steel by Electrothermal-Atomic Absorption Spectrometry with Direct Atomization of a Solid Sample, and Shapes of Absorption Signals Based on Atomization Process of the Elements
- A Practical Method for Determining Minimum Detectable Values in Pulse-Counting Measurements
- Ga^+ Primary Ion ToF-SIMS Fragment Pattern of Metals and Inorganic Compounds