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Siemens Ag | 論文
- CONTROL OPTIMIZATION FOR AUTOMATIC TRANSMISSION
- GaAs Substrate Material Assessment Using a High Lateral Resolution MESFET Test Pattern
- A Direct-Overwrite Scheme for Magneto-Optical Memory Systems with an In-Plane Magnetized Control Layer
- Non-linear Feature Extraction by Redundancy Reduction in an Unsupervised Stochastic Neural Network
- Linear Redundancy Reduction Learning