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Showa Denko K.k. Saitama Jpn | 論文
- Spurious Peaks in Total Reflection X-Ray Fluorescence Analysis
- Origins of Spurious Peaks of Total Reflection X-Ray Fluorescence Analysis of Si Wafers Excited by Monochromatic X-Ray Beam W-Lβ
- Influence of Standing Waves on Impurity Analysis of Si(001) Wafer Using Commercially Available Total-Reflection X-Ray Fluorescence Analyzer
- Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ(II)
- Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ (I)
- Influence of Crystal Thermal History on Surface Recombination Lifetime at Elevated Temperatures in Magnetic-Field-Applied Czochralski Silicon