スポンサーリンク
School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan | 論文
- Evaluation of Electron and Hole Mobility at Identical Metal–Oxide–Semiconductor Interfaces by using Metal Source/Drain Ge-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors
- Comparison between Laser Thomson Scattering and Spectroscopic Measurements in Low Temperature Helium Plasmas in Divertor/Edge Simulator MAP-II
- Application of the Liquid-Crystal-Based Tunable Lyot Filter to the Optical Emission Imaging Plasma Spectrometry
- Thomson Scattering Measurements of Helium Recombining Plasmas in the Divertor Simulator MAP-II
- Development of Heat Flow Measurement using Thermal Probe Method in Divertor Simulator MAP-II