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Research Laboratory, Sony Corporation | 論文
- Microscopic Examination of SrTiO_3 at Low Temperatures
- Dielectric Constant of Strontium Titanate at Low Temperatures
- Reduction of CrO_3 into CrO_2 and Cr_2O_3 under Very High Pressure and High Temperature
- Dielectric Constant of PbTe
- Microwave Observations of Carrier Behaviors in "Osillistors"