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Research Center Sony Corporation | 論文
- Effect of sputtering conditions on the exchange-biasing of NiFe/IrMn layers prepared by UHV-ICP sputtering system
- Electronic Structures of PbTiO_3: I. Covalent Interaction between Ti and O Ions
- Sub 100 Nanosecond Pretilted Planar-to-Homeotropic Reorientation of Nematic Liquid Crystals under High Electric Field
- Disk Mastering Process with an All-Solid-State Ultraviolet Laser
- An Automatic Correction Circuit for Respiratory Mass Spectrometers
- Electronic Structures of PbTiO_3: II. Properties of Pb Ion Displacement
- Photon-Induced Random Telegraph Signal Due to Potential Fluctuation of a Single Donor-Acceptor Pair in Nanoscale Si p-n Junctions