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Nec Corporation Microelectronics Research Laboratories | 論文
- Thinning of SOI Bonded Wafers by Applying Voltage during KOH Etching: Improvement of Thickness Variation by Reducing Leakage Current
- Selective Epitaxial Growth of InAs on GaAs by Molecular Beam Epitaxy
- Strained N-Ga_Al_As/In_xGa_As/GaAs Modulation-Doped Structures