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Nano and Bio Technology Research Division, Daegu Gyeongbuk Institute of Science and Technology | 論文

• Oxygen Dispersive Diffusion Induced Bias stress Instability in Thin Active Layer Amorphous ln-Ga-Zn-O Thin-Film Transistors
• Oxygen Dispersive Diffusion Induced Bias Stress Instability in Thin Active Layer Amorphous In-Ga-Zn-O Thin-Film Transistors

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