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Nano High-Tech Research Center, Toyota Technological Institute | 論文
- Development of Four-Probe Microscopy for Electric Conductivity Measurement
- Simultaneous Measurement of Topography and Contact Current by Contact Mode Atomic Force Microscopy with Carbon Nanotube Probe
- Temperature-Dependent Contrasts of Lateral p^+-n Junctions on H/Si(100) Imaged with Photoemission Electron Microscopy
- Growth of Carbon Nanowalls on a SiO_2 Substrate by Microwave Plasma-Enhanced Chemical Vapor Deposition
- Microwave Plasma-Enhanced Chemical Vapor Deposition of Carbon Nanostructures Using Biological Molecules