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Microelectronics Technology Research Laboratory Electronics And Telecommunications Research Institut | 論文
- Electrical Properties of SrBi_2Ta_2O_9/Insulator/Si Structures with Various Insulators
- Characterization of Aluminum Nitride Thin Films on Silicon Substrates Grown by Plasma Assisted Molecular Beam Epitaxy
- Glancing-Angle Electron Beam Bombardment for Modification of GaN Epilayer Growth using Plasma-Assisted Molecular Beam Epitaxy