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Materials Departments, University of California | 論文
- Characterization of Planar Semipolar Gallium Nitride Films on Sapphire Substrates
- Structural Characterization of Thick GaN Films Grown on Free-Standing GaN Seeds by the Ammonothermal Method Using Basic Ammonia
- Polarized Light Emission from Nonpolar InGaN Light-Emitting Diodes Grown on a Bulk m-Plane GaN Substrate
- Characterization of Planar Semipolar Gallium Nitride Films on Spinel Substrates