スポンサーリンク
Materials And Electronic Devices Laboratory Mitsubishi Electric Corporation | 論文
- Local Structures of Carbon Thin Films Synthesized by the Hot Filament Chemical Vapor Deposition Method X-Ray-Absorption Near-Edge Structure and Raman Spectroscopic Studies
- Temperature-Dependent Br K-Edge EXAFS Study on AgBr_xCl_ Solid Solutions
- XANES and Raman Spectroscopic Studies of Diamond Films Synthesized by Hot Filament CVD
- Molecular Orientation in the Organized Molecular Films of Fluorinated Comb Polymers with Various Chain Lengths Studied by Soft X-ray Absorption Spectroscopy
- Energy Level Alignment and Band Bending at TPD / Metal Interfaces Studied by Kelvin Probe Method (Special Issue on Organic Molecular Electronics for the 21st Century)
- Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure
- Molecular Oriented Thin Film of Biphenyl-4,4'-dithiol Fabricated by Molecular Beam Deposition Method
- Phase Determination of Second-Order Surface Susceptibility Tensor of Liquid Crystal Monolayer Using Ultra-Thin Film Local Oscillator
- X-Ray Photoelectron Spectroscopy Study of a Self-Assembled Monolayer of Thiophene Thiol
- Ultrathin-film Local Oscillator for Determination of Complex Components of Second-Order Nonlinear Susceptibility
- B-5-6 A New Method for CAS Detection
- Characteristics of Hydrogenated Amorphous Silicon Films Prepared by Electron Cyclotron Resonance Microwave Plasma Chemical Vapor Deposition Method and Their Application to Photodiodes