スポンサーリンク
Material and Life Science Engineering, Faculty of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan | 論文
- In situ Ellipsometric Measurement during Growth of Ge on Si(111) by Molecular Beam Epitaxy
- Monitoring of Si Molecular-Beam Epitaxial Growth by an Ellipsometric Method