スポンサーリンク
Joint Research Center For Atom Technology National Institute Of Advanced Industrial Science And Tech | 論文
- Nanotribology on Polymer Blend Surface by Atomic Force Microscopy
- Scanning Tunneling Microscopy Study on c(6x2) Structure of Ag/Si(001)
- Nature of Tip-Sample Interaction in Dynamic Mode Atomic Force Microscopy
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy
- Investigation of the Peptide Conformation by Measuring Force Curve using AFM
- Measurement of the Length of the α Helical Section of a Peptide Directly Using Atomic Force Microscopy
- Nonisothermal Crystallization Kinetics of Poly(butylene succinate) and Poly(ethylene succinate)
- Electrical Characterization of Atomic-Scale Defects in an Ultrathin Si Oxynitride Layer
- Electrical Characterization of Atomic-Scale Defects in an Ultrathin Si Oxynitride Layer