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Iess-cnr | 論文
- Kinetics of Interface State Generation Induced by Hot Carriers in N-Channel Polycrystalline Silicon Thin-Film Transistors
- Electron Beam Lithography Simulation on Homogeneous and Multilayer Substrates
- Kinetics of Interface State Generation Induced by Hot Carriers in N-Channel Polycrystalline Silicon Thin-Film Transistors