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Graduate School Of Engineering Osaka City University | 論文
- Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers (Joint Special Issue on Photonics in Switching : Systems and Devices)
- Optical Path Cross-Connect System Using Matrix Wavelength Division Multiplex Scheme (Joint Special Issue on Photonics in Switching : Systems and Devices)
- Transfer Function Matrix Measurement of AWG Multi/Demulti-Plexers (Joint Special Issue on Photonics in Switching : Systems and Devices)
- Optical Path Cross-Connect System Ushing Matrix Wavelength Division Multiplex Scheme (Joint Special Issue on Photonics in Switching : Systems and Devices)
- Novel Structural Transformation around Lu(III) and Unusual Bending of Acetylacetonato Chelate in A Series of New 3d-4f Dinuclear Complexes [(hfac)_3Ln(μ-bpypz)Cr(acac)_2]
- Synthesis, Stereochemistry, and Spin Transition of Heterometal Dinuclear Fe(II)-Cr(III) Complex Bridged by 3,5-Bis(pyridin-2yl)-pyrazolate
- データダウンロードにおける相対的評価値測定(品質管理,NGN管理,サービス管理,ユーザ管理及び一般)
- B-14-15 施策の変更によるネットワークトポロジへの影響とその評価(B-14.テレコミュニケーションマネジメント,一般講演)
- B-7-132 通信効率と耐攻撃性をともにみたすネットワークトポロジの検討(B-7.情報ネットワーク,一般講演)
- Screening for EGFR-Binding Peptides by Multi-Component Fluorescent Labeling Method
- Emulation of retinal cell responses during fixational eye movements
- Bacterial Attachment and Initiation of Biofilms on the Surface of Copper Containing Stainless Steel
- Total Synthesis of Prostaglandin F_ Using Nickel-Catalyzed Stereoselective Cyclization of 1,3-Diene and Tethered Aldehyde via Transmetalation of Nickelacycle with Diisobutylaluminum Acetylacetonate
- 画像ベース・ナビゲーションのための変動に強いサインボード認識
- モフォロジー演算と相対色によるセグメンテイションを用いたロバストな交通標識の認識
- A-5-5 POWER CONSUMPTION REDUCTION USING DISTRIBUTED BEAMFORMING IN RELAY NETWORK WITH MULTI-ANTENNA RECEIVER
- FOREWORD
- A High Power Narrowband Interference Rejection Technique Using Multi-stage Canceller for DS-CDMA Systems
- A Narrowband Interference Rejection Technique for DS-CDMA System
- IDDQ Test Time Reduction by High Speed Charging of Load Capacitors of CMOS Logic Gates(Special Issue on Test and Verification of VLSI)