スポンサーリンク
Grad. Sch. Sci. Hiroshima Univ. | 論文
- 21pGP-5 Substrate effect on the edge states of epitaxial graphenen grown on 4H-SiC(0001) studied by STM/STS
- 25aYG-7 Edge states of epitaxially grown graphene on 4H-SiC(0001) studied by scanning tunneling microscopy and spectroscopy (STM/STS)
- 24pQE-6 LaMnO_3のMn K吸収端における線二色性測定II(24pQE 軟X線発光・散乱・放射光真空紫外分光・MCD・光電子分光,領域5(光物性))
- 25aWX-1 Interference of Dirac electrons on the surface of Bi_2Se_3 studied by scanning tunneling microscopy
- 25aPS-62 Electronic structures of ferromagnetic shape memory alloy Ni_2Mn_Sn_ studied by hard-x-ray photoelectron spectroscopy
- 25pPSA-50 Electronic structures of Ni_2Mn_Sn_ upon the martensitic phase transition studied by X-ray magnetic circular dichroism (XMCD)
- 25aRA-4 Electronic and magnetic structures of Heusler-type alloys Ru_Fe_xCrGe
- 25aRA-3 Electronic structures of Ni_2MnGa upon the martensitic phase transition studied by X-ray magnetic circular dichroism (XMCD)
- 27pTH-8 The electronic structures correlated with the martensitic transition in Ni_2Mn_Sn_
- 22pPSB-19 Nucleation of Si atoms on Si(111) surface
- 22pPSB-1 Graphene epitaxially grown on the step with unit-cell height of 4H-SiC(0001) substrate
- 20pQG-10 Electronic structures of Ni_Co_xMnGa studied by x-ray photoemission spectroscopy
- 25pWK-1 Electronic structures of half-heusler alloys XPtSn (X=Ti, Zr, Hf) studied by X-ray photoemission spectroscopy
- 25pWK-2 Electronic Structures of Heusler-Type Alloys Ru_Fe_xCrZ (Z=Ge,Sn) : Studied by Soft X-ray Photoelectron Spectroscopy
- 24pPSA-40 Interaction of Co Atoms with Si(111) Surface Studied by Scanning Tunneling Microscopy II
- 21pXJ-9 Interaction of Co Atoms with Si (111) Surface Studied by Scanning Tunneling Microscopy
- 22aPS-33 Photoemission spectroscopy of XPtSn(X=Ti, Zr, Hf, Mn)
- 23aXH-2 Electronic Structures of Fe_V_xSi Probed by Photoemission Spectroscopy
- 26aPS-2 High-resolution angle-resolved photoemission study of Al(100) single crystal
- Detection of Radiation-Induced DNA Damage by an Aldehyde Reactive Probe (ARP)