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Fachbereich Physik Und Wissenschaftliches Zentrum Fur Materialwissenschaften Der Philipps-universita | 論文
- Minority-Carrier Lifetime in Heavily Doped GaAs:C
- Towards the Origin of the Shear Force in Near-Field Microscopy
- Imaging the Internal Structure of Recording Marks on an Optical Disc by Internal Reflection Scanning Near-Field Optical Microscopy