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Dept. of Materials Science and Engineering, National Defense Academy | 論文
- Substrate Dependence of Photoacoustic Spectra on 3, 4, 9, 10-Perylenetetracarboxylic Dianhydride (PTCDA) Films(Evaluation Methods and Characterization of Organic Materials)(Recent Progress in Organic Molecular Electronics)
- Spectral Analysis of Deep Level Transient Spectorscopy (SADLTS) of Deep Centers in CdTe Single Crystals : Electrical Properties of Condensed Matter
- Multiexponential and Spectral Analysis of Carrier Emission Processes from Co-Related Deep Levels in p-Silicon
- Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of DX-centers in Al_xGa_As:Sn : Electrical Properties of Condensed Matter
- Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS)
- Thermoelectric Characteristics of Sintered SiC/Cu Semiconductors
- Thermoelectric Properties of Amorphous Ge/Au and Si/Au Thin Films
- Size Effects on Photoacoustic Spectra for GaAs Fine Powder
- AC Measurement of Seebeck Coefficient in Disk-Shaped Semiconductors Using CW-Lasers
- Excitation Spectrum of 3.39 μm Tansmission Modulation by Tunable CW-CO_2 Laser in p-Ge
- Theory of CW-Laser-Induced Dynamic Grating by Inter-Valence-Band Absorption in p-Type Semiconductors
- CW-Laser Induced Dynamic Grating and Subpicosecond Hole Relaxation Time in p-Ge
- Deep Trap Measurement in Hg_Cd_xTe by Isothermal Capacitance and Deep-Level Transient Spectroscopy
- Improvement of Signal-to-Noise Ratio in Microphone Photoacoustic Spectroscopy
- Chopping Frequency Dependence of Photoacoustic Spectrum in Porous Silicon
- Amplitude and Phase Signals of the Photothermal Deflection Images
- Thermoelectric Properties of and Dopant Distribution in SiC Thin Films
- Photoacoustic Spectrum and Surface Morphology of Porous Silicon
- Band Gap of Porous Silicon Estimated by Photoacoustic Spectra
- ポリシラスチレンにより密度制御したSiC/Cu系の熱電特性