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Department of Molecular Science and Technology, Ajou University, Suwon 442-749, Korea | 論文
- Experimental Setup for in Situ Investigation of Phase Changing Behavior in Phase-Change Random-Access Memory Medium by Microfocusing Nanosecond-Time-Resolved Ellipsometry
- High-Temperature Complex Refractive Index of Phase Change Recording Medium of Ge2Sb2Te5 Determined Using Phase Change Static Tester and Spectroscopic Ellipsometer
- Optical Property of PtOx at Elevated Temperatures Investigated by Ellipsometry
- Irreversible Optical Properties of AgOx Mask Layer with Temperature for Super-Resolution Near-Field Structure Application Investigated by in situ, ex situ Ellipsometry
- Properties of the Electrical-Discharge Plasma-Density in a High Pressure Gas Mixture
- Enhanced Readout Signal of Elliptic-Bubble Super Resolution Near Field Structure by Temperature-Dependent Complex Refractive Index of Phase-Change Medium
- Virtual Cathode Oscillator under Various Cathode Radii with Intense Relativistic Electron Beam