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Department of Materials and Nuclear Engineering, University of Maryland | 論文
- Observation of Dark Line Defects in Optically Degraded ZnS_xSe_-based Light Emitting Diodes by Transmission Electron Microscopy
- Imprint in Ferroelectric Capacitors
- Observation of Dark Line Defects in Optically Degraded ZnS_xSe_-Based LEDs by Transmission Electron Microscopy