スポンサーリンク
Department of Materials Technology, Chiba University | 論文
- Beating of the Shubnikov-de Haas Oscillations in GaAs/AlGaAs Quantum-Dot Arrays
- Modeling of Electron Transport in Corrugated Quantum Wires
- Ballistic Weak Localization and Wave Function Scarring in Quantum Wires
- Is There a Magnetic-Field-Induced Breakdown in the Universality of Conductance Fluctuations?
- Chaotic Behavior in the Magneto-Resistance of Quantum Dot and Quantum Point Contact(Quantum Mechanics and Chaos)
- Phase Breaking of Coherent Electron Waves in Dot Array Systems ( Quantum Dot Structures)
- The Role of Electron Phase Coherence in Quantum Transport through Open Ballistic Cavities ( Quantum Dot Structures)
- Trajectory Transition Due to Gate Depletion in Corrugation Gated Quantum Wires
- Electron Wave Interference in Ballistic and Quasi-Ballistic Nanostructures
- Study of Scattering Processes in Quantum Wires by a Correlation Field Analysis of the Phase Coherent Interferences
- The Magnetic Field Dependent Characteristics of Conductance Fluctuations in Ballistic Quantum Dots
- Experimental Determination of the Conduction Width in Quasi Ballistic Wires
- Interference Area of Universal Conductance Fluctuations in Narrow GaAs/AlGaAs Wires
- Transition from Semi-Classical to Quantum Transport in Quasi-Ballistic Wires
- Photodegradable Toners for Electrophotography III. Accelerated Photodegradation and Suppressed Photocrosslinking of Matrix Resin-Their Dependence on Polymer Composition, UV-light Source, and Irradiation Conditions
- Photodegradable Toners for Electrophotography II. Accelerated Photodegradation of Matrix Resin by Deep Ultraviolet-Exposure at an Elevated Temperature
- A Surface-Silylated Single-Layer Resist Using Chemical Amplification for Deep-Ultraviolet Lithography : I.Limited Permeation of Si Compounds from Vapor Phase
- Cross-Sectional Transmission Electron Microscope Observation of Small Structures Made by Field-Induced Scanning Tunneling Microscope Fabrication
- Non-Linear Transports in Evaporated C_ Cluster Films
- Correlation Field Analysis of the Influence of Device Geometry and Bulk Disorder on Electron Interference in Quantum Wires