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Department of Materials Science, Faculty of Engineering, Kyushu Institute of Technology | 論文
- Green, Orange, and Magenta Luminescence in Strontium Stannates with Perovskite-Related Structures
- Energy-Dispersive Synchrotron Radiation Topographic Observation of InAs/GaAs Lattice-Mismatched Layer
- X-ray Penetration Depth for Large Lattice-Mismatched Heteroepitaxial Layer by Dynamical Diffraction Theory using Computer Simulation
- Laue-Case Plane Wave Topography Using Synchrotron Radiation to Reveal Microdefects in a Thinned Silicon Crystal
- Observation of Microdefects in Thin Silicon Crystals by Means of Plane-Wave Topography Using Synchrotron X-Radiation
- Extinction of X-Ray Topographic Images of Copper Precipitates in Silicon Single Crystals
- Development of Electrochemical Protease Assay
- Depth-Sensitive X-Ray Scattering Topographic Observation of InAs Grown by Molecular Beam Epitaxy on GaAs
- Difference of Electronic Structures between NaInO_2 and NaInS_2
- Surface Modification of Titanium using Laser Beam
- Wettability of Zirconia and Alumina Ceramics by Molten Zinc
- Scattering Tomography
- High-Resolution X-Ray Scattering Topography Using Synchrotron Radiation Microbeam
- Green, Orange, and Magenta Luminescence in Strontium Stannates with Perovskite-Related Structures