スポンサーリンク
Department of Information Sciences, Kanagawa University, Hiratsuka, Kanagawa 259-1293, Japan | 論文
- Characterization of Hot-Implanted Fe near the SiO2/Si Interface
- Interdiffusion Analysis of Au/Ti and Au/Pt/Ti Electrode Structures Grown on Diamond (001) Surface by Rutherford Backscattering Spectroscopy