スポンサーリンク
Department of Electronics and Electrical Engineering, Keio University, Yokohama 223-8522, Japan | 論文
- Economic slump and suicide method : Preliminary study in Kobe
- Cr
- 1/f Noise Characteristics of Fin-Type Field-Effect Transistors in Saturation Region
- Electrical Resistivity Measurements of Layer Number Determined Multilayer Graphene Wiring for Future Large Scale Integrated Circuit Interconnects
- Cr^-Doped Y_3Al_5O_ as a Saturable Absorber for a Q-Switched and Mode-Locked 639-nm Pr^-Doped LiYF_4 Laser