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Department of Electronics Engineering, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C. | 論文
- Annealing Effect on Boron High-Energy-Ion-Implantation-Induced Defects in Si
- Composite-Channel Metamorphic High Electron Mobility Transistor for Low-Noise and High-Linearity Applications
- Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress
- High-Performance Radio Frequency Passive Devices on Plastic Substrates for Radio Frequency Integrated Circuit Application