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Department of Electronics, University of industrial Technology | 論文
- Measurement Technique for Depth Profiling in Time-Domain Low-Coherence Interferometer
- Influence of Inelastic Scattering on the Relaxation Time at Low Temperature : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Metals and Semiconductors
- Highly Precise Alignments Using Moire Diffraction Methods
- Recovery of Laser-Diode Coherence Length by a Photorefractive Double Phase-Conjugate Mirror
- Enhancement of the Lohmann-Type Computer-Generated Hologram Encoded by Direct Multilevel Search Algorithm