スポンサーリンク
Department of Electronics, Osaka Sangyo University, 3-1-1 Nakagaito, Daito, Osaka 574-8530, Japan | 論文
- A Study of Surface Resistance of Si(100)
- Effects of Ag Thickness and Deposition Temperature on Prevention of Cu Diffusion in Cu/Ag/Si System
- Resistance Change in Thin Ag Film on Si (100)