スポンサーリンク
Department of Electronic Engineering, Osaka Institute of Technology | 論文
- 90°Phase-Matching Properties of YCa_4O(BO_3)_3 and Gd_x Y_Ca_4O(BO_3)_3
- Observation of Intrinsic Josephson Junction Propertieson (Bi,Pb)SrCaCu0 Thin Films
- Theoretical Evaluation of Compositional Contrast of Scanning Electron Microscope Images
- Theoretical Evaluation of a Topographic Contrast of Scanning Electron Microscope Images : Inspection and Testing
- Theoretical Evaluation of a Topographic Contrast of Scanning Electron Microscope Images
- A Simulation of Electron Scattering in Metals : Inspection and Testing
- A Simulation of the Topographic Contrast in the SEM : Inspection and Testing
- A Simulation of the Topographic Contrast in the SEM
- A Simulation of Electron Scattering in Metals
- Analysis of Charging Effect During Observation of Trench Structures by Seanrting Electron Microscope
- Simulation of Scanning Electron Microscope Image for Trench Structures
- Monte Carlo Calculations on the Passage of Electrons through Thin Films Irradiated by 300 keV Electrons
- 90° Phase-Matching Properties of YCa4O(BO3)3 and GdxY1-xCa4O(BO3)3