スポンサーリンク
Department of Electrical and Electronic Engineering, Faculty of Engineering, Utsunomiya University | 論文
- Scanning Tunneling Microscopy, X-Ray Photoelectron Spectroscopy and Electron Energy-Loss Spectroscopy Studies of the Misfit Layer Compounds {(Pb_Sb_xS)_}mTS 2 (T=Ti and Nb; m=1 and 2)
- Observation of Josephson Junctionlike Behavior in Single-Crystal (Bi, Pb)_2Sr_2CaCu_2O_y
- X-Ray Spectra and Electronic Structures of CuS and Cu_2S
- The Effect of Nonuniform Doping Density on Electron States in n-Type Si Inversion Layers