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Department of Electrical Engineering, Hosei University | 論文
- A 0.65-ns, 72-kb ECL-CMOS RAM Macro for a 1-Mb SRAM(Special Issue on the 1994 VLSI Circuits Symposium)
- Suppression of Microloading Effect by Low-Temperature SiO_2 Etching
- A Case of Pseudomembranous Aspergillus Tracheobronchitis in an Asthma Patient Receiving Inhaled Corticosteroid Therapy