スポンサーリンク
Department of Applied Physics, Tokyo University of Science, Tokyo 162-8601, Japan | 論文
- Electronic Structure in Valence Band of Nd-Substituted Bi4Ti3O12 Single Crystal Probed by Soft-X-Ray Emission Spectroscopy
- Effect of Mn Substitution for Multiferroic BiFeO3 Probed by High-Resolution Soft-X-ray Spectroscopy
- Electronic Structures of Bi4-xLaxTi3O12 and Bi4ZrxTi3-xO12 Single Crystals Studied by Soft-X-Ray Spectroscopy
- Structural and Ferroelectric Properties of Ba2NaNb5O15 Thin Films on La-Doped SrTiO3 Substrates
- Ferroelectric and Structural Properties of Sr0.5Ba0.5Nb2O6 Thin Films on La0.05Sr0.95TiO3 Substrate
- Bulk Electronic State of SrTiO3-δ Probed by Resonant Soft-X-Ray Emission Spectroscopy