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Department of Applied Physics, Hokkaido University | 論文
- Dielectric properties of NaCl-doped ice at 9.7 GHz
- ORIENTATION OF THE 700-M MIZUHO CORE AND ITS STRAIN HISTORY
- Measurements of total gas content of an ice core from Mizuho Station, Antarctica
- The effect of hydrostatic pressure on the formation of air-hydrate crystals
- RELATION BETWEEN THE SSM/I BRIGHTNESS TEMPERATURE AND DIRECTION OF THE MAXIMUM SURFACE SLOPE IN EAST QUEEN MAUD LAND, ANTARCTICA
- Pressure-induced Crossover from Variable Range Hopping to Electron-Electron Interaction in the Organic Conductor (DOET)_2BF_4(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Spin-Wave Dynamics of Percolating Heisenberg Antiferromagnets
- Spectral Dimension of Percolating Heisenberg Antiferromagnets
- Localization Exponents of Waves in Percolation Systems
- Energy-Dependent Effective Mass Approximation in One-Dimensional Quantum Dots ( Quantum Dot Structures)
- Sub-5-fs Pulse Compression of Laser Output Using Photonic Crystal Fiber with Short Zero-Dispersion Wavelength
- Femtosecond Time-Resolved Third-Order Nonlinear Response of 4-(N, N-Diethylamino)-β-Nitrostyrene Solutions in the Nonresonant Region : Experimental Evidence of Group-Velocity Dispersion Effect
- Numerical Analysis of Femtosecond Time-Resolved Degenerate Four-Wave Mixing Signal including Group-Velocity Dispersion Effect
- Structure Transformation of the C Defects Observed at Low Temperature (80 K)
- Femtosecond Refractive-Index Nonlinearities in a Flint Glass Single-Mode Fiber
- Resistivity Correction Factor for the Four-Point Probe Method on Cylindrical Materials
- Resistivity Correction Factor for the Four-Ring Probe Method
- Resistivity Correction Factor for the Four-Probe Method: Experiment III
- Evaluation of Overlay Accuracy for 100-nm Ground Rule in Proximity X-Ray Lithography
- Metallization of (TTM-TTP)I_3 with a Highly One-Dimensional Half-Filled Band under Extremely High Pressure(Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties)