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Department Of Mathematical Andco Mputing Sciences Tokyo Institute Of Technology | 論文
- Quantitative intensity measurement of equal thickness fringes in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate
- Transmiccion electron microscopy study of a semiconducting SrTiO_3 ceramic condenser
- Cathodoluminescence scanning electron microscopy observations of (SrBaCa)TiO_3 ceramic varistors
- A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder
- An Efficient Anonymous Group Identification Scheme with Short Secret Keys(Information Security)