スポンサーリンク

Dep. of Electronic Engineering, Minghsin University of Science and Technology University | 論文

• Improvement of the Leakage by Second Thermal Oxidation Process Power Trench Gate MOSFET(Session6: Power Devices)
• Improvement of the Leakage by Second Thermal Oxidation Process Power Trench Gate MOSFET(Session6: Power Devices)

スポンサーリンク