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Advanced Technology Group, CS Management Center, SAMSUNG ELECTRONICS CO., LTD | 論文
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Electrical Overstress Failure Mechanism Investigation about High-power Scan Driver IC for Plasma Display Panel(Session A7 High Power Devices)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))