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ASET EUV Process Technology Laboratory | 論文
- Heat Sink Dependency of Mask In-Plane Displacement for Extreme Ultraviolet Lithography
- Assessment of Heat Deformation and Throughput for Selecting Mask Substrate Material for Extreme Ultraviolet Lithography
- Modeling of In-Plane Distortion of Extreme Ultraviolet Lithography Mask in Flat State
- Estimation of Mask Placement Error Caused by Multilayer Stress Profile
- Pattern Printability for Variation in Thickness of a Mo/Si Mask Blank in Extreme Ultraviolet Lithography