Chen Jone | Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.

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• Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.の論文著者

Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan, R.O.C. | 論文

• The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability

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