Shin Jiaw-Ren | Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park

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• 同名の論文著者
• Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Parkの論文著者

Department of Electrical Engineering, Tsing-Hua University:Taiwan Semiconductor Manufacturing Company, R & D No.9, Creation Rd. I Science Based Industrial Park | 論文

• A Novel Thin Gate-Oxide-Thickness Measurement Method by LDD (Lightly-Doped-Drain)-NMOS (N-Channel Metal-Oxide-Semiconductor) Transistors

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