Zhang Jing | Microelectronics Department, North China University of Technology, Beijing 100041, China

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概要

関連著者

Wang Xiaolei
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Han Kai
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Wang Wenwu
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Ma Xueli
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Xiang Jinjuan
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Chen Dapeng
Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
Zhang Jing
Microelectronics Department, North China University of Technology, Beijing 100041, China

著作論文

Electric dipole at high-k/SiO2 interface and physical origin by dielectric contact induced gap states (Special issue: Dielectric thin films for future electron devices: science and technology)

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