Shimizu Hirofumi | Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagahara, Tokusada, Tamura-machi, Koriyama, Fakushima 963-8642, Japan

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• Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagahara, Tokusada, Tamura-machi, Koriyama, Fakushima 963-8642, Japanの論文著者

Department of Electrical and Electronic Engineering, College of Engineering, Nihon University, 1 Aza-Nakagahara, Tokusada, Tamura-machi, Koriyama, Fakushima 963-8642, Japan | 論文

• Behavior of Metal-Induced Negative Oxide Charges on the Surface of N-type Silicon Wafers Using Frequency-Dependent AC Surface Photovoltage Measurements

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