Nakashima Yoshiki | Device Platforms Research Laboratories, NEC Corporation
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概要
Device Platforms Research Laboratories, NEC Corporation | 論文
- Channel Strain in Advanced CMOSFETs Measured Using Nano-Beam Electron Diffraction
- Three-Terminal Device Based on the Current-Induced Magnetic Vortex Dynamics with the Magnetic Tunnel Junction
- Electrical Detection of Vortex Core Polarity in Ferromagnetic Disk
- Current-Driven Domain Wall Motion in CoCrPt Wires with Perpendicular Magnetic Anisotropy
- Fine Structure of O^- Kinetic Energy Distribution in RF Plasma and Its Formation Mechanism