KWON Hyuk-Min | Dept. of Electronics Engineering, Chungnam National Univ.
スポンサーリンク
概要
Dept. of Electronics Engineering, Chungnam National Univ. | 論文
- Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
- Effect of Temperature on the Bandwidth and Responsivity of Uni-Traveling-Carrier and Modified Uni-Traveling-Carrier Photodiodes
- Improved Efficiency-Bandwidth Product of Modified Uni-Traveling Carrier Photodiode Structures Utilizing an Undoped Photo-Absorption Layer