KAMITANI Atsushi | Yamagata University, 4-3-16, Johnan, Yonezawa 992-8510, Japan
スポンサーリンク
概要
関連著者
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Nakamura Hiroaki
National Inst. Fusion Sci. Toki Jpn
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KAMITANI Atsushi
Yamagata University, 4-3-16, Johnan, Yonezawa 992-8510, Japan
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TAKAYAMA Teruou
Yamagata University, Yamagata 992-8510, Japan
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SAITOH Ayumu
University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280, Japan
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ITOH Taku
Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan
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KAMITANI Atsushi
Yamagata University, Yamagata 992-8510, Japan
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ITOH Taku
Seikei University, 3-3-1, Kichijoji-Kitamachi, Musashino, Tokyo 180-8633, Japan
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Nakamura Hiroaki
National Institute For Fusion Science
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KAMITANI Atsushi
Yamagata University, 4-3-16, Johnan, Yonezawa, Yamagata 992-8510, Japan
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MATSUI Nobuyuki
University of Hyogo, Himeji 671-2280, Japan
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ITOH Taku
Seikei University, 3-3-1 Kichijoji-Kitamachi, Musashino-shi, Tokyo 180-8633, Japan
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ITOH Taku
Seikei University, 3-3-1, Kichijoji-Kitamachi, Musashino 180-8633, Japan
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SAITOH Ayumu
Graduate School of Engineering, University of Hyogo, Himeji, Hyogo 671-2280, Japan
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TAKAYAMA Teruou
Yamagata University
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SAITOH Ayumu
University of Hyogo
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SAITOH Ayumu
University of Hyogo, 2167, Shosha, Himeji, Hyogo 671-2280, Japan
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SAITOH Ayumu
University of Hyogo, Himeji 671-2280, Japan
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KAMITANI Atsushi
Yamagata University
著作論文
- Numerical Investigation on Accuracy Improvement of Permanent Magnet Method for Measuring jC in High-Temperature Superconducting Film
- New Implementation Method for Essential Boundary Condition to Extended Element-Free Galerkin Method: Application to Nonlinear Problem
- Efficient Evaluation of Influence Coefficients in Three-Dimensional Extended Boundary-Node Method for Potential Problems
- Numerical Simulation of Contactless Methods for Measuring jC Distribution of High Temperature Superconducting Thin Film
- Numerical Investigation on Accuracy and Resolution of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Inductive Method and Permanent Magnet Method
- Accurate and Stable Numerical Method for Analyzing Shielding Current Density in High-Temperature Superconducting Film Containing Cracks