Takahashi Eiichi | National Institute of Advanced Industrial Science and Technology (AIST), Central 2 (MBOX 35225), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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- National Institute of Advanced Industrial Science and Technology (AIST), Central 2 (MBOX 35225), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japanの論文著者
National Institute of Advanced Industrial Science and Technology (AIST), Central 2 (MBOX 35225), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan | 論文
- An Additional 12% Power Reduction in Practical Digital Chips with a Low-Power Design Using Post-Fabrication Clock-Timing Adjustment
- An Extended Method of Higher-order Local Autocorrelation Feature Extraction for Classification of Histopathological Images