Nakanishi Shunsuke | Department of Advanced Materials Science, Faculty of Engineering, Kagawa University, 2217-20 Hayashi-cho, Takamatsu 761-0396, Japan
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- Department of Advanced Materials Science, Faculty of Engineering, Kagawa University, 2217-20 Hayashi-cho, Takamatsu 761-0396, Japanの論文著者
Department of Advanced Materials Science, Faculty of Engineering, Kagawa University, 2217-20 Hayashi-cho, Takamatsu 761-0396, Japan | 論文
- Electron Spin Resonance Observation of Bias-Temperature Stress-Induced Interface Defects at NO/N2O-Annealed Chemical-Vapor-Deposition SiO2/(100) p-Si Substrates
- Structural Analyses of Fractional Monolayer $(\text{GaAs})_{m}/(\text{AlAs})_{n}$ Superlattices by X-ray Resonant/Off-Resonant Scattering
- Ultrafast Exciton Dynamics in (AlAs)0.3/(GaAs)0.7 Ultrashort-Pperiod Superlattice
- Ellipsometric Spectroscopy of Liquid Selenium-Thallium Mixtures(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Transient Wetting of Liquid Selenium-Thallium Mixtures on a Silica Substrate(Condensed matter: structure and mechanical and thermal properties)